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| Titel |
Electromagnetic fluctuations due to electron shear flow instabilities in collisionless magnetic reconnection |
| VerfasserIn |
Neeraj Jain, Joerg Buechner |
| Konferenz |
EGU General Assembly 2015
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| Medientyp |
Artikel
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| Sprache |
Englisch
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| Digitales Dokument |
PDF |
| Erschienen |
In: GRA - Volume 17 (2015) |
| Datensatznummer |
250112690
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| Publikation (Nr.) |
 EGU/EGU2015-12860.pdf |
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| Zusammenfassung |
| In Collision-less magnetic reconnection electron scale current sheets (thickness
~ de = c/Ïpe ) develop embedded inside an ion scale current sheet (thickness
~ di = c/Ïpi).These electron current sheets (ECS) are susceptible to electron shear flow
instabilities (ESFI). The ESFI can grow both as tearing, which forms electron scale magnetic
islands, and non-tearing modes which may cause filamentation of the ECS. Usually
experiments do not capture the growth phase of an instability. However they do record
electromagnetic fluctuations, such as in VINETA-II and Magnetic Reconnection
Experiment (MRX), possibly resulting from the non-linearly saturated state of the
instabilities. We study electromagnetic fluctuations in non-linearly saturated state
of ESFIs. An electron-magnetohydrodynamic model is used for the 2-D and 3-D
nonlinear simulations of ESFI. The 2-D simulations are carried out in two mutually
perpendicular planes: (1) plane perpendicular to the equilibrium electron current and (2)
plane containing the directions of equilibrium current and shear in it. Such 2-D
simulations will help us isolating the fluctuations caused by tearing and non-tearing
modes. The effect of current sheet thickness and guide field will be investigated. |
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